Near-Infrared Sensitivity Enhancement of Silicon Image Sensor by Photon Confinement with Plasmonic Diffraction

講演情報

Oral Presentation

01: Advanced CMOS: Material Fundamentals / Process Science / Device Physics

[G-5] Image Sensor Technology

2022年9月28日(水) 10:45 〜 12:15 301 (3F)

Session Chair: Takashi Matsukawa (AIST), Hidetoshi Oishi (Sony Semiconductor Solutions Corp.)

12:00 〜 12:15

〇Takahito Yoshinaga¹, Kazuma Hashimoto¹, Nobukazu Teranishi², Atsushi Ono^1,2 (1. Shizuoka Univ. (Japan), 2. RIE Shizuoka Univ. (Japan))

Presentation style: On-site (in-person)

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