2023 International Conference on Solid State Devices and Materials

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Oral Presentation

10: Thin Film Electronics: Oxide / Non‐single Crystalline / Novel Process

[E-5] Oxide semiconductor TFTs and technology

Fri. Sep 8, 2023 9:00 AM - 10:15 AM Room E (223, Bldg. 2)

Session Chairs: Juan Paolo Bermundo (NAIST), Jun Koyama (Semiconductor Energy Lab.)

9:00 AM - 9:15 AM

[E-5-01 (Late News)] Electrical Characteristic Degradation of Ultra-Scaled IGZO-TFTs Induced by Bias- and Temperature-Dependent Hot Carrier Stresses

○Muhammad Aslam1,2, Shu-Wei Chang3, Yao Jen Lee4, Yiming Li1,2,4,5,6,7, Wen-Hsi Lee3 (1. Parallel and Scientific Computing Laboratory, National Yang Ming Chiao Tung Univ. (Taiwan), 2. EECS International Graduate Program, National Yang Ming Chiao Tung Univ. (Taiwan), 3. Department of Electrical Engineering, National Cheng Kung Univ. (Taiwan), 4. Institute of Pioneer Semiconductor Innovation, National Yang Ming Chiao Tung Univ. (Taiwan), 5. Institute of Communications Engineering, National Yang Ming Chiao Tung Univ. (Taiwan), 6. Institute of Communications Engineering, National Yang Ming Chiao Tung Univ. (Taiwan), 7. Department of Electronics and Electrical Engineering, National Yang Ming Chiao Tung Univ. (Taiwan))

https://doi.org/10.7567/SSDM.2023.E-5-01

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