International Display Workshops General Incorporated Association

Proceedings of the International Display Workshops Volume 27 (IDW '20)

Proceedings of the International Display Workshops Volume 27 (IDW '20)

2020年12月9日 〜 2020年12月11日
Virtual Conference

16:10 〜 18:10

[DESp1-2] A Novel a-IGZO TFT Scan Driver Circuit Using Only One Pull-Down Transistor

*Jungwoo Lee1, Yong-Sang Kim1, Jae-Hong Jeon2, KeeChan Park3, Soo-Yeon Lee4 (1. Sungkyunkwan University(Korea), 2. Korea Aerospace University(Korea), 3. Konkuk University(Korea), 4. Seoul National University(Korea))

a-IGZO TFT, Reliability, Scan Driver Circuit, Depletion Mode, Pull-Down TFT

https://doi.org/10.36463/idw.2020.0868

This paper proposes new scan driver to prevent output ripple voltage which can be generated by CLK. Using only one pull-down TFT with 50% turn-on duty ratio, proposed circuit can obtain both high reliability for continuous bias stress and fully cut-off ripple voltage by using negative VGS for pull-up TFT.