[A-2-6] Soft Error Rate Analysis Model(SERAM) for Dynamic NMOS RAMs

Masaaki Aoki、Toru Toyabe、Takashi Shinoda、Toshiaki Masuhara、Shojiro Asai、Hiroshi Kawamoto、Kazumichi Mitsusada (1.Central Research Laboratory, Hitachi Ltd.、2.Device Development Center, Hitachi Ltd.)

https://doi.org/10.7567/SSDM.1981.A-2-6