[A-2-6] Soft Error Rate Analysis Model(SERAM) for Dynamic NMOS RAMs

Masaaki Aoki, Toru Toyabe, Takashi Shinoda, Toshiaki Masuhara, Shojiro Asai, Hiroshi Kawamoto, Kazumichi Mitsusada (1.Central Research Laboratory, Hitachi Ltd., 2.Device Development Center, Hitachi Ltd.)

https://doi.org/10.7567/SSDM.1981.A-2-6