[A-2-4] Hot-Electron Trapping Effects of Short Channel 64 K dynamic MOS RAM

M. Yamada, H. Matsumoto, T. Kobayashi, M. Kumanoya, M. Taniguchi, T. Nakano (1.LSI Research and Development Laboratory, Mitsubishi Electric Corporation)

https://doi.org/10.7567/SSDM.1982.A-2-4