[C-3-4LN] FABRICATION OF SUBMICRON SEMICONDUCTOR DEVICES BY HOLOGRAPHIC METHOD --- IV SUBMICRON GATE PROCESS
N. NOMURA, Y. HIROFUJI, T. EDAMATSU, K. KUGIMIYA
(1.Central Research Lab., Matsushita Electric Industrial Co., Ltd.)
https://doi.org/10.7567/SSDM.1983.C-3-4LN