[B-7-4] Noise Modeling of New MOS Imaging Device Using Random Noise Suppression (RANS) Circuits

T. Ozaki, N. Ozawa, T. Imaide, H. Ando, S. Ohba (1.Central Research Laboratory, Hitachi, Ltd.)

https://doi.org/10.7567/SSDM.1984.B-7-4