Hot Electron Induced Punchthrough in Submicron PMOSFETs

Mitsumasa Koyanagi; Alan G. Lewis; Russel A. Martin; Tiao- Yuan Huang; John Y. Chen

doi:https://doi.org/10.7567/SSDM.1986.A-9-1

1986 International Conference on Solid State Devices and Materials

Aug 20, 1986 - Aug 22, 1986
Tokyo Prince Hotel, Tokyo, Japan

[A-9-1] Hot Electron Induced Punchthrough in Submicron PMOSFETs

Mitsumasa Koyanagi, Alan G. Lewis, Russel A. Martin, Tiao- Yuan Huang, John Y. Chen (1.Xerox, Palo Alto Research Center, Integrated Circuit Laboratory)

https://doi.org/10.7567/SSDM.1986.A-9-1

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