[A-9-1] Hot Electron Induced Punchthrough in Submicron PMOSFETs

Mitsumasa Koyanagi、Alan G. Lewis、Russel A. Martin、Tiao- Yuan Huang、John Y. Chen (1.Xerox, Palo Alto Research Center, Integrated Circuit Laboratory)

https://doi.org/10.7567/SSDM.1986.A-9-1