[D-11-3] Improved Reliability in Amorphous Silicon Thin Film Transistors

Y. Kaneko、A. Sasano、T. Tsukada、R. Oritsuki、K. Suzuki (1.Central Research Laboratory, Hitachi, Ltd.、2.Mobara Works, Hitachi, Ltd.)

https://doi.org/10.7567/SSDM.1986.D-11-3