[D-11-3] Improved Reliability in Amorphous Silicon Thin Film Transistors

Y. Kaneko, A. Sasano, T. Tsukada, R. Oritsuki, K. Suzuki (1.Central Research Laboratory, Hitachi, Ltd., 2.Mobara Works, Hitachi, Ltd.)

https://doi.org/10.7567/SSDM.1986.D-11-3