[S-D-5] Hot Carrier Degradation of 0.5 μm Surface and Buried Channel PMOS FETs

Katsuyoshi Mitsui、Masahide Inuishi、Shigeru Kusunoki、Hidekazu Oda、Katsuhiro Tsukamoto (1.LSI R&D Laboratory, Mitsubishi Electric Corporation)

https://doi.org/10.7567/SSDM.1989.S-D-5