Correlation between Density of States Distributions and the Fermi Level Position in Interfacial Regions of Amorphous Silicon Thin Film Transistors

[S-E-24] Correlation between Density of States Distributions and the Fermi Level Position in Interfacial Regions of Amorphous Silicon Thin Film Transistors

S. C. Deane、W. I. Milne、M. J. Powell、J. R. Hughes、I. D. French (1.Cambridge University Engineering Department、2.Philips Research Laboratories)