[B-2-6] Analysis of Smear Noise in Interline-CCD Image Sensor with Gate-Free Isolation Structure

Hideyuki Ono、Toshifumi Ozaki、Haruhiko Tanaka、Yoshifumi Kawamoto (1.Central Research Laboratory, Hitachi Ltd.)

https://doi.org/10.7567/SSDM.1991.B-2-6