[PC1-2] A New Forward-Bias Capacitance Spectroscopy for Characterization of Interface States in GaAs Schottky Gate

Chung Gyune Choi、Sheng San Li、Kye Hwan Oh (1.Semiconductor R&D Center, Hyundai Electron. Ind. Co.、2.Dept. of Electrical Engineering, University of Florida)

https://doi.org/10.7567/SSDM.1991.PC1-2