[S-F-8] Surface Analysis of YBa2Cu3O7-x Thin Films by QMS, XPS and LEED: Effects of IN-VACUUM Annealing

T. NAKAMURA, S. TANAKA, M. IIYAMA, N. YOSHIDA, S. TAKANO (1.Information & Electronics Lab., Osaka Research Lab., Sumitomo Electric Industries, Ltd.)

https://doi.org/10.7567/SSDM.1991.S-F-8