[A-3-2] A New Prediction Method for Hot Carrier Degradation of Submicron PMOSFET with Charge Pumping Technique
Takahisa HAYASHI, Hisashi FUKUDA, Akira UCHIYAMA, Toshiyuki IWABUCHI
(1.Semiconductor Tech. Lab., Oki Electric Industry Co., Ltd.)
https://doi.org/10.7567/SSDM.1992.A-3-2