[A-3-2] A New Prediction Method for Hot Carrier Degradation of Submicron PMOSFET with Charge Pumping Technique

Takahisa HAYASHI, Hisashi FUKUDA, Akira UCHIYAMA, Toshiyuki IWABUCHI (1.Semiconductor Tech. Lab., Oki Electric Industry Co., Ltd.)

https://doi.org/10.7567/SSDM.1992.A-3-2