[A-3-2] A New Prediction Method for Hot Carrier Degradation of Submicron PMOSFET with Charge Pumping Technique

Takahisa HAYASHI、Hisashi FUKUDA、Akira UCHIYAMA、Toshiyuki IWABUCHI (1.Semiconductor Tech. Lab., Oki Electric Industry Co., Ltd.)

https://doi.org/10.7567/SSDM.1992.A-3-2