[B-5-1] Parallel Data Inspection Operation in Three-Dimensional Content Addressable Memory with Optical Interconnection

H. Okano, H. Takata, T. Nakano, T. Tanaka, S. Miyazaki, M. Hirose, H. Tsukamoto, S. Yokoyama, R. Aibara, M. Koyanagi (1.Research Center for Integrated Systems, Hiroshima University, 2.Mitsubishi Heavy Industries Ltd., Hiroshima Laboratory)

https://doi.org/10.7567/SSDM.1992.B-5-1