The Japan Society of Applied Physics

[PA3-1] An Analytical Model for Substrate and Gate Current of Stressed SC-PMOSFET in the Saturation Region

Kwang Sun Yang、Jong Tae Park、Bong Ryul Kim (1.Dept. of Electronics Eng., Yonsei University、2.Dept. of Electronics Eng., Incheon University)

https://doi.org/10.7567/SSDM.1992.PA3-1