[PA3-2] Determination of the Interface Trap Density in MOSFETs from the Subthreshold Slope Measurement

Jong-Son LYU、Kee-Soo NAM、Choochon LEE (1.Electronics and Telecommunications Research Institute、2.Department of Physics, Korea Advanced Institute of Science and Technology)

https://doi.org/10.7567/SSDM.1992.PA3-2