[S-IV-3] High Speed 0.1 μm CMOS Devices Operating at Room Temperature

A. Toriumi, T. Mizuno, M. Iwase, M. Takahashi, H. Niiyama, M. Fukumoto, S. Inaba, I. Mori, M. Yoshimi (1.ULSI Research Center, Toshiba Corporation)

https://doi.org/10.7567/SSDM.1992.S-IV-3