[C-1-3] Device Simulation with Quasi Three-Dimensional Temperature Analysis for Short Channel Poly-Si TFT

Tamio SHIMATANI, Takuji MATSUMOTO, Takeshi HASHIMOTO, Noriji KATO, So YAMADA, Mitsumasa KOYANAGI (1.Research Center for Integrated Systems, Hiroshima University, 2.Fuji Xerox Co.)

https://doi.org/10.7567/SSDM.1993.C-1-3