[LC-6] Assessment of Hot Carrier Effects on the High Frequency Characteristics of NMOS Transistors

J. H. Yoo, K. D. Yoo, J. H. Jin, G. H. Lim, Y. S. Choi, D. G. Kim, S. K. Lim, K. H. Choi (1.Process Development Dept., Micro Division, Samsung Electronics Co.)

https://doi.org/10.7567/SSDM.1993.LC-6