[PB-3-10] A Study of Short Channel Behavior of Accumulation Type SOI MOSFETs

H.-O. Joachim, Y. Yamaguchi, Y. Inoue, T. Nishimura, N. Tsubouchi (1.Mitsubishi Electric Corporation, ULSI Laboratory)

https://doi.org/10.7567/SSDM.1993.PB-3-10