[S-II-16] Three Dimensional Molecular Dynamics Study of Void Electromigration in a Strained Bicrystal with a Grain Boundary

Shoso Shingubara, Taizo Fujii, Isao Utsunomiya, Yasuhiro Horiike (1.Dept. of Electrical Engineering, Hiroshima University)

https://doi.org/10.7567/SSDM.1993.S-II-16