[S-II-3] Hot-Carrier Related Phenomenon in MOSFETs with Furnace N2O-Nitrided Gate Oxides

G. W. Yoon, J. Ahn, G. Q. Lo, D. L. Kwong (1.Microelectronics Research Center The University of Texas at Austin)

https://doi.org/10.7567/SSDM.1993.S-II-3