[A-11-3] A New PMOSFET's Hot-Carrier Degradation Model for Bi-Directional Operation

S. Shimizu、M. Tanizawa、S. Kusunoki、M. Inuishi、N. Tsubouchi (1.ULSI Laboratory, Mitsubishi Electric Corporation)

https://doi.org/10.7567/SSDM.1994.A-11-3