[B-2-2] A Flash Memory Technology for Operating Voltage Reduction and Self-Convergence of the Over Erased Cells

S. Sato, T. Tanigami, K. Hakozaki, N. Shinmura, K. Iguchi, K. Sakiyama (1.VLSI Development Laboratories, IC Group, SHARP Corporation)

https://doi.org/10.7567/SSDM.1995.B-2-2