[B-2-2] A Flash Memory Technology for Operating Voltage Reduction and Self-Convergence of the Over Erased Cells

S. Sato、T. Tanigami、K. Hakozaki、N. Shinmura、K. Iguchi、K. Sakiyama (1.VLSI Development Laboratories, IC Group, SHARP Corporation)

https://doi.org/10.7567/SSDM.1995.B-2-2