[B-2-4] High-Reliability Programming Method Suitable for Flash Memories of More Than 256 Mb

Naoki Miyamoto, Takayuki Kawahara, Syun-ichi Saeki, Yusuke Jyouno, Masataka Kato, Katsutaka Kimura (1.Hitachi Device Engineering, Co., Ltd., 2.Central Research Laboratory, Hitachi Ltd., 3.Semiconductor & Integrated Circuits Division, Hitachi Ltd.)

https://doi.org/10.7567/SSDM.1995.B-2-4