[D-1-2] Nanometer-Scale Current-Voltage Spectra Measurement of Resonant Tunneling Diodes Using Scanning Force Microscopy

Masafumi TANIMOTO, Kiyoshi KANISAWA, Masanori SHINOHARA (1.NTT LSI Laboratories, 2.NTT Basic Research Laboratories)

https://doi.org/10.7567/SSDM.1995.D-1-2