[D-6-5] Electrical Properties of Ferroelectric Gate HEMT Structures

Shun-ichiro OHMI, Makoto YOSHIHARA, Takeo OKAMOTO, Eisuke TOKUMITSU, Hiroshi ISHIWARA (1.Precision & Intelligence Laboratory, Tokyo Institute of Technology)

https://doi.org/10.7567/SSDM.1995.D-6-5