[PC-4-2] Tail Electron Hydrodynamic Model for Consistent Modeling of Impact Ionization and Gate Injection

Jae-Gyung Ahn、Young-June Park、Hong-Shick Min (1.ULSI Laboratory, LG Semicon, Co. Ltd.、2.Department. of Elec. Eng. and ISRC, Seoul Nat'l. University)

https://doi.org/10.7567/SSDM.1995.PC-4-2