[PC-9-6] Schottky Barrier Height Reduction for p-ZnSe Contacts by Sulfur Treatment
M. Onomura, S. Saito, J. Rennie, Y. Nishikawa, P. J. Parbrook, M. Ishikawa, G. Hatakoshi
(1.Materials and Devices Research Laboratories, Toshiba Corporation)
https://doi.org/10.7567/SSDM.1995.PC-9-6