[S-I-10-3] Imprint in PZT Capacitors: Causes and Solutions

W. L. Warren、D. Dimos、G. E. Pike、B. A. Tuttle、M. V. Raymond、R. Ramesh、J. T. Evans, Jr. (1.Sandia National Laboratories、2.Department of Materials and Nuclear Engineering University of Maryland、3.Radiant Technologies Inc.)

https://doi.org/10.7567/SSDM.1995.S-I-10-3