[S-V-2] Observation of <100> Dark Line Defects in Optically Degraded ZnSxSe1-x-Based LEDs by Transmission Electron Microscopy

L. Salamanca-Riba、L. H. Kuo (1.Department of Materials and Nuclear Engineering, University of Maryland)

https://doi.org/10.7567/SSDM.1995.S-V-2