[B-7-1] Optimum Voltage Scaling and Structure Design for the Low Voltage Operation of FN Type Flash EEPROM with High Reliability and Constant Programming Time

S. Ueno, H. Oda, N. Ajika, M. Inuishi, H. Miyoshi (1.ULSI Laboratory, Mitsubishi Electric Corporation)

https://doi.org/10.7567/SSDM.1996.B-7-1