Defects in Si Thin-Film Transistors Studied by Spin-Dependent Transport

Genshiro KAWACHI; Carlos F. O. GRAEFF; Martin S. BRANDT; Martin STUTZMANN

doi:https://doi.org/10.7567/SSDM.1996.PC-2-1

1996 International Conference on Solid State Devices and Materials

1996年8月26日〜 1996年8月29日
Pacifico Yokohama, Yokohama, Japan

[PC-2-1] Defects in Si Thin-Film Transistors Studied by Spin-Dependent Transport

Genshiro KAWACHI、Carlos F. O. GRAEFF、Martin S. BRANDT、Martin STUTZMANN (1.Hitachi Research Laboratory, Hitachi Ltd.、2.Walter Schottky Institut, Technische Universitat Munchen)

https://doi.org/10.7567/SSDM.1996.PC-2-1

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