Defects in Si Thin-Film Transistors Studied by Spin-Dependent Transport

Genshiro KAWACHI; Carlos F. O. GRAEFF; Martin S. BRANDT; Martin STUTZMANN

doi:https://doi.org/10.7567/SSDM.1996.PC-2-1

1996 International Conference on Solid State Devices and Materials

Aug 26, 1996 - Aug 29, 1996
Pacifico Yokohama, Yokohama, Japan

[PC-2-1] Defects in Si Thin-Film Transistors Studied by Spin-Dependent Transport

Genshiro KAWACHI, Carlos F. O. GRAEFF, Martin S. BRANDT, Martin STUTZMANN (1.Hitachi Research Laboratory, Hitachi Ltd., 2.Walter Schottky Institut, Technische Universitat Munchen)

https://doi.org/10.7567/SSDM.1996.PC-2-1

▲