[PD-7-3] Built-in Electric Field Strength in InP/n+-InP Determined by Photoellipsometry and Photoreflectance

Yi-Ming XIONG, Tadashi SAITOH Hiroyuki YAGUCHI, Yasuhiro SHIRAKI (1.Division of Electronic and Information Engineering Tokyo University of Agriculture and Technology, 2.Research Center for Advanced Science and Technology University of Tokyo)

https://doi.org/10.7567/SSDM.1996.PD-7-3