[Sympo.I-11] A Method of Hot Carrier Lifetime Prediction in Partially-Depleted Floating SOI NMOSFETs

S. Maeda, Y. Yamaguchi, I.-J. Kim, H. O. Joachim, Y. Inoue, H. Miyoshi, A. Yasuoka (1.ULSI Laboratory, Mitsubishi Electric Corporation)

https://doi.org/10.7567/SSDM.1996.Sympo.I-11