[Sympo.I-11] A Method of Hot Carrier Lifetime Prediction in Partially-Depleted Floating SOI NMOSFETs

S. Maeda、Y. Yamaguchi、I.-J. Kim、H. O. Joachim、Y. Inoue、H. Miyoshi、A. Yasuoka (1.ULSI Laboratory, Mitsubishi Electric Corporation)

https://doi.org/10.7567/SSDM.1996.Sympo.I-11