Fabrication and Characterization of Nb/Nb Oxides-Based Single Electron Transistors (SETs)

Jun-ichi SHIRAKASHI; Masami ISHII; Kazuhiko MATSUMOTO Naruhisa MIURA; Makoto KONAGAI

doi:https://doi.org/10.7567/SSDM.1996.Sympo.III-4

1996 International Conference on Solid State Devices and Materials

Aug 26, 1996 - Aug 29, 1996
Pacifico Yokohama, Yokohama, Japan

[Sympo.III-4] Fabrication and Characterization of Nb/Nb Oxides-Based Single Electron Transistors (SETs)

Jun-ichi SHIRAKASHI, Masami ISHII, Kazuhiko MATSUMOTO Naruhisa MIURA, Makoto KONAGAI (1.Electrotechnical Laboratory (ETL), 2.Tokyo Institute of Technology)

https://doi.org/10.7567/SSDM.1996.Sympo.III-4

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