Fabrication and Characterization of Nb/Nb Oxides-Based Single Electron Transistors (SETs)

Jun-ichi SHIRAKASHI; Masami ISHII; Kazuhiko MATSUMOTO Naruhisa MIURA; Makoto KONAGAI

doi:https://doi.org/10.7567/SSDM.1996.Sympo.III-4

1996 International Conference on Solid State Devices and Materials

1996年8月26日〜 1996年8月29日
Pacifico Yokohama, Yokohama, Japan

[Sympo.III-4] Fabrication and Characterization of Nb/Nb Oxides-Based Single Electron Transistors (SETs)

Jun-ichi SHIRAKASHI、Masami ISHII、Kazuhiko MATSUMOTO Naruhisa MIURA、Makoto KONAGAI (1.Electrotechnical Laboratory (ETL)、2.Tokyo Institute of Technology)

https://doi.org/10.7567/SSDM.1996.Sympo.III-4

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