[Sympo.IV-7] Experimental Evidence of Hot Electron Detection with Scanning Hot Electron Microscopy (SHEM)

F. Vazquez, D. Kobayashi, I. Kobayashi, K. Furuya, Y. Miyamoto, T. Maruyama, M. Watanabe, M. Asada (1.Department of Electrical and Electronic Engineering, Tokyo Institute of Technology)

https://doi.org/10.7567/SSDM.1996.Sympo.IV-7