[C-5-5] Electrical Properties of ZnSe/ZnSe Homointerfaces Formed by MBE Regrowth Process

Yuji Yamagata、Koji Fujiwara、Takayuki Sawada、Kazuaki Imai、Kazuhiko Suzuki、Isao Tsubono (1.Department of Applied Electronics, Hokkaido Institute of Technology)

https://doi.org/10.7567/SSDM.1997.C-5-5