A Unified Model for Charge Defect Generation in a-SiH: Photo-Induced Defects in Photovoltaic (PV) Devices and Current Induced Defects in Thin Film Transistors (TFTs)

Hong YANG; Gerald LUCOVSKY

doi:https://doi.org/10.7567/SSDM.1997.D-13-1

[D-13-1] A Unified Model for Charge Defect Generation in a-SiH: Photo-Induced Defects in Photovoltaic (PV) Devices and Current Induced Defects in Thin Film Transistors (TFTs)

Hong YANG、Gerald LUCOVSKY (1.Department of Chemistry, North Carolina State University、2.Departments of Physics, Materials Science and Engineering, and Electrical and Computer Engineering, North Carolina State University)

https://doi.org/10.7567/SSDM.1997.D-13-1

1997 International Conference on Solid State Devices and Materials

[D-13-1] A Unified Model for Charge Defect Generation in a-SiH: Photo-Induced Defects in Photovoltaic (PV) Devices and Current Induced Defects in Thin Film Transistors (TFTs)