[B-3-5] Characteristics and Correlated Fluctuations of the Gate and Substrate Current after Oxide Soft-Breakdown

F. Crupi, R. Degraeve, G. Groeseneken, T. Nigam, H. E. Maes (1.IMEC, 2.Department of Information Engineering, The University of Pisa)

https://doi.org/10.7567/SSDM.1998.B-3-5